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eMMC153-169 to USB3.0
eMMC153/169 to USB3.0 alloy clamshell pogo pin socket for eMMC NAND flash test and data recovery
parameter
Application IC | eMMC153/169 (eMMC2.x~eMMC4.x~eMMC5.x) |
Device Function | data recovery |
IC size | 9*11mm 10*11mm 11.5*13mm 12*16mm 12*18mm 14*18mm |
eMMC/eMCP thickness | 0.8mm - 1.5mm |
Software | Basic section version |
Interface | USB3.0 port |
PRODUCT FEATURES
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Small spacing
minimum pitch of 0.2mm
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test accuracy
The test is accurate and the error rate is 0.001 %
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High temperature
high temperature: 175 ℃, low temperature: -55 ℃
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long service life
Life span more than 300,000 times, 2-3 times that of other similar brands
Advantage
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1.support many NAND flash chips; -
2.USB3.0 standard , it can be recovered the data fast; -
3.Android NAND flash check and data recovery and read/write well.
Product image
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